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Characterization and analysis of gate-all-around Si nanowire transistors for extreme scaling.

Ru HuangRunsheng WangJing ZhugeChangze LiuTao YuLiangliang ZhangXin HuangYujie AiJinbin ZouYuchao LiuJiewen FanHuailin LiaoYangyuan Wang
Published in: CICC (2011)
Keyphrases
  • statistical analysis
  • genetic algorithm
  • quantitative analysis
  • databases
  • similarity measure
  • bayesian networks
  • evolutionary algorithm