A Test Method for a Broad Class of DSP Circuits.
Érika F. CotaLuigi CarroMarcelo LubaszewskiPublished in: LATW (2001)
Keyphrases
- high precision
- high accuracy
- theoretical analysis
- classification accuracy
- model selection
- detection method
- optimization algorithm
- multi class
- feature set
- segmentation algorithm
- multi class classification
- real time
- test data
- support vector machine svm
- training samples
- cost function
- pairwise
- objective function
- multiscale
- similarity measure