Parallelizable Bayesian optimization for analog and mixed-signal rare failure detection with high coverage.

Hanbin Hu Peng Li Jianhua Z. Huang

Published in: ICCAD (2018)

Keyphrases

mixed signal
failure detection
low power
multi channel
vlsi circuits
digital circuits
low cost
power consumption
cmos technology
fault detection
low voltage
expert systems
high speed
analog to digital converter
artificial intelligence
embedded systems
image sequences
image processing
knowledge base