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One-way Loss Pattern Sample Metrics.

Rajeev KoodliRayadurgam Ravikanth
Published in: RFC (2002)
Keyphrases
  • pattern matching
  • evaluation metrics
  • sample points
  • pattern discovery
  • randomly selected
  • small sample
  • data sets
  • information systems
  • feature selection
  • image segmentation
  • sample size
  • test data
  • pattern detection