An Adaptive BIST to Detect Multiple Stuck-Open Faults in CMOS circuits.

Hafizur Rahaman Debesh K. Das Bhargab B. Bhattacharya

Published in: ASP-DAC (1999)

Keyphrases

built in self test
high speed
detection method
analog vlsi
detection algorithm
delay insensitive
vlsi circuits
artificial neural networks
automatic detection
low power
integrated circuit
power dissipation
chip design