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Improving Small-Delay Fault Coverage of On-Chip Delay Measurement by Segmented Scan and Test Point Insertion.
Wenpo Zhang
Kazuteru Namba
Hideo Ito
Published in:
IEICE Trans. Inf. Syst. (2014)
Keyphrases
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high speed
low cost
small number
data acquisition
power dissipation
information systems
critical path
processor sharing