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High Repair-Efficiency BISR Scheme for RAMs by Reusing Bitmap for Bit Redundancy.

Chih-Sheng HouJin-Fu Li
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2015)
Keyphrases
  • bit wise
  • high efficiency
  • protection scheme
  • bit string
  • learning objects
  • pseudorandom
  • multiple description coding
  • database systems
  • highly efficient
  • authentication scheme