Mismatch-Tolerant Circuit for On-Chip Measurements of Data Jitter.
Kiyotaka IchiyamaMasahiro IshidaTakahiro J. YamaguchiMani SomaPublished in: CICC (2007)
Keyphrases
- data sets
- data analysis
- synthetic data
- data collection
- data processing
- data sources
- high speed
- analog vlsi
- database
- original data
- statistical analysis
- prior knowledge
- high quality
- databases
- data points
- small number
- probability distribution
- input data
- end users
- data structure
- missing data
- data distribution
- raw data
- training data
- measurement data