Multi-GHz loopback testing using MEMs switches and SiGe logic.

David C. Keezer Dany Minier Patrice Ducharme Doris Viens Greg Flynn John McKillop

Published in: ITC (2007)

Keyphrases

logic programming
high speed
classical logic
digital circuits
real time
learning algorithm
software testing
multiresolution
modal logic
frequency band
dual channel