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Compact and Fast Fault Injection System for Robustness Measurements on SRAM-Based FPGAs.

Uli KretzschmarArmando AstarloaJaime JimenezMikel GarayJavier Del Ser
Published in: IEEE Trans. Ind. Electron. (2014)
Keyphrases
  • fault injection
  • java card
  • fault model
  • power consumption
  • data processing
  • business processes
  • static analysis