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Data-Driven-Based Analog Beam Selection for Hybrid Beamforming Under mm-Wave Channels.
Yin Long
Zhi Chen
Jun Fang
Chintha Tellambura
Published in:
IEEE J. Sel. Top. Signal Process. (2018)
Keyphrases
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data driven
cross section
real time
image registration
signal processing
hybrid learning
average error
analog circuits
multiple input multiple output
rms error