CUSUM charts for detecting special causes in integrated process control.
Marion R. Reynolds Jr.Changsoon ParkPublished in: Qual. Reliab. Eng. Int. (2010)
Keyphrases
- process control
- cumulative sum
- control charts
- statistical process control
- control system
- intelligent control
- product quality
- manufacturing process
- neural network
- anomaly detection
- semiconductor manufacturing
- supervised learning
- graduate education
- database
- automatic detection
- software engineering
- machine learning
- real time