Accelerated reliability testing of flash memory: Accuracy and issues on a 45nm NOR technology.
Marcello CalabreseCarmine MiccoliChristian Monzio CompagnoniLuca ChiavaroneSilvia BeltramiAndrea ParisiSebastiano BartoloneAndrea L. LacaitaAlessandro S. SpinelliAngelo ViscontiPublished in: ICICDT (2013)