Investigation on CDM ESD events at core circuits in a 65-nm CMOS process.

Chun-Yu Lin Tang-Long Chang Ming-Dou Ker

Published in: Microelectron. Reliab. (2012)

Keyphrases

cmos technology
high speed
event detection
genetic algorithm
event sequences
data mining
infrared
human activities
temporal data
news stories
analog circuits
logic circuits
power reduction
tunnel diode