Si-based Ka-band SIW band-pass filter using wafer level manufacturing process.
Hanxiang ZhuJun LiLiqiang CaoJia CaoPengwei ChenPublished in: IEICE Electron. Express (2021)
Keyphrases
- manufacturing process
- bandpass
- frequency band
- low pass
- high pass
- quality control
- process control
- frequency domain
- manufacturing systems
- control system
- product design
- product quality
- high frequency
- discrete event
- subband
- low frequency
- discrete wavelet transform
- image processing
- filter bank
- grey level
- wavelet decomposition
- wavelet transform
- process planning
- real time
- zero crossing
- wavelet packet
- filter responses
- geometric distortions
- simulation model
- high resolution