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Redistribution in wafer level chip size packaging technology for high power device applications: Process and design considerations.

Jiunn ChenYi-Shao LaiChueh-An HsiehChia Yi Hu
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • design considerations
  • high power
  • high density
  • high speed
  • low cost
  • design process
  • low power
  • cost effective
  • random access memory
  • metadata
  • high resolution
  • integrated circuit