testability schemes for detecting multiple faults in CMOS ICs.

Changku Hwang Mohammed Ismail Joanne DeGroat

Published in: IEEE J. Solid State Circuits (1996)

Keyphrases

multiple faults
fault diagnosis
discrete event
low cost
low power
dynamic systems
power consumption
analog vlsi
power supply
automatic detection
high speed
multi agent systems
machine learning
evolutionary algorithm
search space
expert systems
circuit design
image processing
vlsi circuits
information systems