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Sub-threshold Leakage Current Differential Age Sensor for Identifying Reused Integrated Circuits.
Mahesh Kumar Singh
Palaka Uma Maheswara Rao
Vella Satyanarayana
Published in:
ACI@ICAIDS (2023)
Keyphrases
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integrated circuit
sensor data
electron beam
sensor networks
low cost
real time
leakage current
image sequences
cost effective