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Bounds on the Length of Terminal Stuck-Fault Test.

C. Dennis Weiss
Published in: IEEE Trans. Computers (1972)
Keyphrases
  • lower bound
  • feature selection
  • upper bound
  • vc dimension
  • machine learning
  • worst case
  • fault diagnosis
  • error bounds
  • upper and lower bounds
  • tight bounds
  • minimum length
  • fault model