A DFT Method for Core-Based Systems-on-a-Chip Based on Consecutive Testability.
Tomokazu YonedaHideo FujiwaraPublished in: Asian Test Symposium (2001)
Keyphrases
- computational cost
- preprocessing
- significant improvement
- experimental evaluation
- high accuracy
- high precision
- detection method
- prior knowledge
- cost function
- dynamic programming
- neural network
- classification method
- mathematical model
- optimization method
- retrieval systems
- synthetic data
- optimization algorithm
- input data
- low cost
- support vector machine