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Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing.

M. K. MahadevaiahEduardo PérezChristian WengerAlessandro GrossiCristian ZambelliPiero OlivoFinn ZahariHermann KohlstedtMartin Ziegler
Published in: IRPS (2019)
Keyphrases
  • reliability analysis
  • high speed
  • low cost
  • power consumption
  • floating gate
  • image processing
  • case study
  • video sequences
  • circuit design