A genetic algorithm for probe testing problem on high-density PCB.
Keisuke MurakamiPublished in: IEEE Congress on Evolutionary Computation (2012)
Keyphrases
- high density
- genetic algorithm
- low density
- close proximity
- data center
- high power
- thin film
- fitness function
- high bandwidth
- optimization method
- tabu search
- simulated annealing
- magnetic tape
- artificial neural networks
- database systems
- magnetic recording
- test cases
- genetic algorithm ga
- neural network
- evolutionary computation
- general purpose
- crossover operator
- fuzzy logic
- steady state
- field effect transistors
- printed circuit boards
- job shop scheduling problem
- genetic programming
- low cost
- multi objective
- data mining