Low-Power Built-In Self-Test Techniques for Embedded SRAMs.
Shyue-Kung LuYuang-Cheng HsiaoChia-Hsiu LiuChun-Lin YangPublished in: VLSI Design (2007)
Keyphrases
- low power
- low cost
- power consumption
- high speed
- embedded systems
- high power
- single chip
- built in self test
- low power consumption
- wireless transmission
- digital signal processing
- vlsi circuits
- vlsi architecture
- logic circuits
- mixed signal
- signal processor
- real time
- cmos technology
- image sensor
- digital images
- gate array
- energy dissipation
- low voltage
- image processing