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Influence of the magnetic field on dielectric breakdown in memristors based on h-BN stacks.

David MaldonadoJuan Bautista RoldánAndrés M. RoldánFrancisco Jiménez-MolinosFei HuiY. ShiXu JingChao WenMario Lanza
Published in: IRPS (2020)
Keyphrases