Local and Global Context-Enhanced Lightweight CenterNet for PCB Surface Defect Detection.

Weixun Chen Siming Meng Xueping Wang

Published in: Sensors (2024)

Keyphrases

lightweight
defect detection
global context
textured surfaces
global information
named entities
feature extraction
sift descriptors
wireless sensor networks
d objects
dos attacks
development environments
keywords
data mining
knn
natural language processing