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A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy.

Jin-Fu LiJen-Chieh YehRei-Fu HuangCheng-Wen WuPeir-Yuan TsaiArcher HsuEugene Chow
Published in: ITC (2003)
Keyphrases
  • database
  • detection scheme
  • redundancy reduction
  • computational complexity
  • steady state
  • multiple description coding