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Destruction failure analysis and international reliability test standard for power devices.
Takashi Setoya
Tsuneo Ogura
Wataru Saito
Tomoko Matsudai
Koichi Endo
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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low cost
highly reliable
reliability analysis
data sets
information systems
feature selection
metadata
clustering algorithm
multi agent systems