Diffraction in the High Frequency Regime by a Thin Layer of Dielectric Material II: the Trace of the Wave in the Shadow of the Obstacle.
Olivier D. LafittePublished in: SIAM J. Appl. Math. (1998)
Keyphrases
- high frequency
- low frequency
- silicon dioxide
- visual quality
- x ray
- signal processing
- high resolution
- wavelet transform
- subband
- high frequencies
- discrete wavelet transform
- wavelet coefficients
- multi resolution analysis
- infrared
- wavelet decomposition
- low pass
- frequency band
- image analysis
- high frequency components
- low and high frequency
- light source
- wavelet domain
- computer vision
- frequency domain
- motion estimation
- image processing