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The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology: (Student paper).
D. Sangani
Javier Diaz-Fortuny
Erik Bury
Ben Kaczer
Georges G. E. Gielen
Published in:
IRPS (2023)
Keyphrases
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cmos technology
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power consumption
spl times
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power dissipation
silicon on insulator
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