Testing of a 32-bit High Performance Embedded Microprocessor.

Jing Wang Shengbing Zhang Zhang Meng

Published in: SIES (2007)

Keyphrases

embedded processors
software testing
embedded dram
cost effective
random access memory
special purpose hardware
test cases
embedded systems
design methodology
general purpose
high speed
software development
low cost
circuit design
scientific computing
magnetic tape
functional verification
neural network