Aliasing Error for a Mask ROM Built-In Self-Test.

Kazuhiko Iwasaki Shigeo Nakamura

Published in: IEEE Trans. Computers (1996)

Keyphrases

reconstruction error
high frequency
error rate
built in self test
frequency domain
genetic algorithm
super resolution
high quality
high resolution
image registration
low cost
low frequency
prediction error
generalization error
error analysis
relative error