Deterministic Identity Testing Paradigms for Bounded Top-Fanin Depth-4 Circuits.

Pranjal Dutta Prateek Dwivedi Nitin Saxena

Published in: Computational Complexity Conference (2021)

Keyphrases

test cases
test data
high speed
computer vision
low cost
test set
depth information
database
data sets
neural network
depth map
power consumption
relaxation algorithm
logic synthesis
vlsi circuits
truth table