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Jump test for metallic CNTs in CNFET-based SRAM.

Feng XieXiaoyao LiangQiang XuKrishnendu ChakrabartyNaifeng JingLi Jiang
Published in: DAC (2015)
Keyphrases
  • digital libraries
  • decision making
  • markov chain
  • test cases
  • data sets
  • neural network
  • web pages
  • search algorithm
  • communication networks
  • low power
  • statistical significance