Login / Signup
Jump test for metallic CNTs in CNFET-based SRAM.
Feng Xie
Xiaoyao Liang
Qiang Xu
Krishnendu Chakrabarty
Naifeng Jing
Li Jiang
Published in:
DAC (2015)
Keyphrases
</>
digital libraries
decision making
markov chain
test cases
data sets
neural network
web pages
search algorithm
communication networks
low power
statistical significance