Multifault testability of delay-testable circuits.

Wuudiann Ke Premachandran R. Menon

Published in: VTS (1995)

Keyphrases

power dissipation
critical path
delay insensitive
vlsi circuits
test data generation
decision trees
power consumption
analog vlsi
circuit design
quantum computing
high level synthesis
database
logic synthesis
electronic circuits
low power
image processing
data mining