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An Effective BIST Architecture for Sequential Fault Testing in Array Multipliers.

Mihalis PsarakisAntonis M. PaschalisDimitris GizopoulosYervant Zorian
Published in: VTS (1999)
Keyphrases
  • high quality
  • data model
  • management system
  • fault diagnosis
  • expert systems
  • control system
  • linear array