Diagnosis of Transistor Shorts in Logic Test Environment.

Yoshinobu Higami Kewal K. Saluja Hiroshi Takahashi Sin-ya Kobayashi Yuzo Takamatsu

Published in: ATS (2006)

Keyphrases

low cost
mobile robot
high speed
logic programming
dynamic environments
autonomous agents
diagnostic tests
knowledge base
modal logic
robotic systems
complex environments
causal reasoning
automatic diagnosis