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Bit-Serial Test Pattern Generation by an Accumulator Behaving as a Non-Linear Feedback Shift Register.
Giorgos Dimitrakopoulos
Dimitris Nikolos
Dimitris Bakalis
Published in:
IOLTW (2002)
Keyphrases
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shift register
random number generator
high speed
hardware implementation
hough transform
random number
information retrieval
relevance feedback
markov random field
machine learning
pattern matching
feedback information
visual feedback