Automating test generation for discrete event oriented embedded systems.
Steven J. CunningJerzy W. RozenblitPublished in: J. Intell. Robotic Syst. (2005)
Keyphrases
- embedded systems
- discrete event
- test generation
- dynamic systems
- test cases
- simulation model
- low cost
- resource limited
- discrete event simulation
- computing power
- embedded devices
- quality assurance
- hardware software
- software testing
- embedded software
- dynamical systems
- real time systems
- static analysis
- software systems
- embedded real time systems
- complex systems
- database
- field programmable gate array
- databases
- hw sw
- life cycle
- information sharing
- database management systems
- multi agent systems
- real time