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Reliability analysis of power gated SRAM under combined effects of NBTI and PBTI in nano-scale CMOS.
Anuj Pushkarna
Hamid Mahmoodi
Published in:
ACM Great Lakes Symposium on VLSI (2010)
Keyphrases
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power consumption
reliability analysis
nano scale
low power
power management
high speed
artificial intelligence
power dissipation
power supply
low voltage
random access memory
loss function
decision trees
decision making
cmos technology
chip design
machine learning