LoOp: Looking for Optimal Hard Negative Embeddings for Deep Metric Learning.
Bhavya VasudevaPuneesh DeoraSaumik BhattacharyaUmapada PalSukalpa ChandaPublished in: ICCV (2021)
Keyphrases
- metric learning
- dimensionality reduction
- distance metric
- distance metric learning
- nearest neighbor classification
- pairwise
- machine learning and pattern recognition
- distance function
- mahalanobis metric
- learning tasks
- semi supervised
- multi task
- feature space
- low dimensional
- distance measure
- semi supervised clustering
- neural network
- semi supervised learning
- vector space
- decision trees