Login / Signup
A Software Technique to Improve Yield of Processor Chips in Presence of Ultra-Leaky SRAM Cells Caused by Process Variation.
Maziar Goudarzi
Tohru Ishihara
Hiroto Yasuura
Published in:
ASP-DAC (2007)
Keyphrases
</>
high speed
computer systems
development process
software design
high end
power consumption
data center
parallel processing
requirements engineering