Robust Numerical Features for Description and Classification of Subcellular Location Patterns in Fluorescence Microscope Images.
Robert F. MurphyMeel VellisteGregory PorrecaPublished in: J. VLSI Signal Process. (2003)
Keyphrases
- x ray
- microscope images
- subcellular location
- classification accuracy
- cross sections
- feature extraction
- feature vectors
- feature set
- classification models
- feature space
- automatic segmentation
- extracted features
- scale invariant
- image features
- support vector machine
- cell nuclei
- feature selection
- keypoints
- invariant features