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Concise Modeling of Transistor Variations in an LSI Chip and Its Application to SRAM Cell Sensitivity Analysis.
Masakazu Aoki
Shin-ichi Ohkawa
Hiroo Masuda
Published in:
IEICE Trans. Electron. (2008)
Keyphrases
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sensitivity analysis
high speed
managerial insights
low power
influence diagrams
random access memory
low cost
power consumption
single chip
latent semantic indexing
data transmission
variational inequalities
power dissipation
d objects
design considerations
circuit design