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Reliability and cost optimization of electronic devices considering the component failure rate uncertainty.

Elias P. ZafiropoulosEvangelos N. Dialynas
Published in: Reliab. Eng. Syst. Saf. (2004)
Keyphrases
  • failure rate
  • electronic devices
  • random variables
  • occurrence probability
  • confidence intervals
  • robust optimization
  • optimization problems
  • production rate
  • optimization algorithm
  • upper bound
  • sample size