Cross-Coupled nFET Preamplifier for Low Voltage SRAM.

Sangheon Lee Jaehyun Park Hanwool Jeong

Published in: IEEE Trans. Circuits Syst. II Express Briefs (2023)

Keyphrases

low voltage
random access memory
leakage current
power line
design considerations
cmos technology
pattern recognition
real time
e learning
power consumption
low power