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A fast and low-cost testing technique for core-based system-chips.
Indradeep Ghosh
Sujit Dey
Niraj K. Jha
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2000)
Keyphrases
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low cost
real time
cost effective
high speed
test cases
low power
integrated circuit
digital camera
hardware and software
information systems
search algorithm
power consumption