Deep Metric Learning Meets Deep Clustering: An Novel Unsupervised Approach for Feature Embedding.
Binh X. NguyenBinh D. NguyenGustavo CarneiroErman TjiputraQuang D. TranThanh-Toan DoPublished in: BMVC (2020)
Keyphrases
- metric learning
- distance metric
- semi supervised
- semi supervised clustering
- unsupervised learning
- multiple features
- maximum variance unfolding
- nearest neighbor classification
- distance metric learning
- clustering algorithm
- multi task
- neural network
- pairwise
- learning tasks
- dimensionality reduction
- spectral clustering
- supervised learning
- pairwise constraints
- image features
- feature set
- k means
- distance function
- clustering method
- unsupervised clustering
- machine learning
- pairwise similarities