Time-Based All-Digital Technique for Analog Built-in Self-Test.
Rajath VasudevamurthyPratap Kumar DasBharadwaj AmruturPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2014)
Keyphrases
- circuit design
- built in self test
- mixed signal
- delta sigma
- printed circuit
- data conversion
- digital data
- digital media
- sigma delta
- digital information
- data structure
- multimedia
- computer vision
- learning algorithm
- data mining
- digital objects
- database
- digital content
- digital imaging
- analog vlsi
- machine learning
- databases
- data sets