HEp-2 specimen classification via deep CNNs and pattern histogram.
Hongwei LiHao HuangWei-Shi ZhengXiaohua XieJianguo ZhangPublished in: ICPR (2016)
Keyphrases
- classification accuracy
- machine learning
- pattern recognition
- classification systems
- classification scheme
- pattern classification
- feature extraction
- support vector
- decision rules
- support vector machine svm
- pattern representation
- feature vectors
- supervised learning
- image classification
- text classification
- support vector machine classification
- feature set
- support vector machine
- decision trees
- feature selection
- gray level
- training samples
- automatic classification
- classification rate
- preprocessing
- classification process
- physical characteristics