Enhancement mode gallium nitride transistor reliability.

Alex Lidow Rob Strittmatter Chunhua Zhou Yanping Ma

Published in: IRPS (2015)

Keyphrases

thin film
room temperature
image enhancement
high speed
image processing
reliability analysis
high density
mixed mode
search engine
low power
integrated circuit
software reliability
magnetic field
multi layer
highly reliable
contrast enhancement
data mining
neural nets
steady state
color images
genetic algorithm